The most download paper in e-Prime journal in the last 90 days -- A review of the state-of-the-art in electronic cooling. Read more: sciencedirect.com/science/articl…

Meet one of our Early Career Editorial Board members – Prof. Jinhao Meng, from Sichuan University, China. His research interests include battery modeling, battery SOC and SOH estimation, and energy management of battery energy storage system.

Matterhorn in the front

Our new study available online. The thermal modeling issue of #ElectricVehicles power #semiconductor module. Feel free to use the following link for first 50 days free access authors.elsevier.com/c/1fpIQ5~JAnh7F

#ElectricVehicles power module structure and thermal impedance, want to know more. The 50 days’ free access link: authors.elsevier.com/c/1fpIQ5~JAnh7F

Fault detection are often investigated in the full-load conditions, but do you know some methods may lose their effectiveness under the light load? Read our new research results to know the risk ResearchGate: researchgate.net/publication/36…

Call for paper: Artificial Intelligence in Electrical Engineering, Electronic and Energy All article fees are waived for the accepted articles. Read more: buff.ly/3fZlnSI

Reunion with the PhD supervisor after finishing PhD two years is a so happy feeling #phd #phdlife #academia

The average output cycle is a often used assumption in renewable energy for power loss estimation, but this assumption does not always work for electric vehicle applications. In the past #IECON2020 in Brussels, we have studied this: ow.ly/axxF50Lp705 #EV #reliability

Visit a hydroelectric plant under ground of Lac Leman, Montreux

Current-voltage curve contains a lot of information for #semicondutors. We with Hitachi Energy (previous ABB), KTH Royal Institute of Technology extend this method to operating conditions. AAU Read more: IEEE(open-access)👉 ieeexplore.ieee.org/document/99449… Researchgate👉researchgate.net/publication/36…

Thermal interface material is far more critical in practical applications than we think! In our past study 👉ow.ly/j9X450LJ0cY we observed 27% thermal resistance increase caused by TIM. It leads to 30 degrees Celsius 🔥 increase, which calls for more research efforts.

New device needs a new testing method. The standard thermal transient measurement of silicon has limitation of applying to #SiC. We deliver the guideline (ow.ly/ZnET50M80xr ) to help a reproducible testing. Feel free to leave your comments to help this work better.

our new work on reproducible SiC MOSFET thermal characterization ieeexplore.ieee.org/document/10387… cooperation with Siemens and Nexperia doi: 10.1109/TIA.2024.3352548

Our testing #dataset of the publication A Gradient-based End-of-Life Criterion for Power Semiconductor Modules (ieeexplore.ieee.org/abstract/docum…) is available on ResearchGate: researchgate.net/publication/37…

e-Prime journal is looking for Associate Editors. If you are interested in editorial work, please read our webpage sciencedirect.com/journal/e-prim… Yi ZHANG