
Masahide Kikkawa
@mkikkawa
ID: 20970370
http://structure.m.u-tokyo.ac.jp/ 16-02-2009 08:19:30
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pubmed.ncbi.nlm.nih.gov/38815089/ A paper on damage caused by electron microscopy by Professor Eiichi Nakamura, who is also a long collaborator with us. The paper states that damage caused by electron beams is not caused by ionization as has been said, but by configurational disordering.