Miss the Model 1062 TrionMill product launch webinar? Catch it now! bit.ly/TrionMillRepeat Learn more about 50 mm SEM sample preparation.

Register for the webinar, "Ion mills for every application." Tomorrow, Jan. 28, at 10 a.m. EST. bit.ly/IonMillsForEve…

Webinar registration is open for "Precise final thinning of FIB-prepared specimens," May 25, 10 a.m. EDT. bit.ly/fischione_prec…

Webinar registration is open for "Precise final thinning of FIB-prepared specimens," May 25, 10 a.m. EDT. bit.ly/fischione_prec…

Join Fischione Instruments' Pawel Nowakowski and Lambda Photometrics at the virtual Microscience Microscopy Congress 2021, Thursday, June 8, 16:00 BST (11 am EDT). Topic: "Advanced sample preparation" featuring Fischione Instruments' TrionMill. #mmc2021

Join our team! We have openings in: --Shipping and receiving --Field service --Electromechanical assembly --CNC machining Go to bit.ly/3BuekXA #pghjobs #pittsburghjobs #hiringpgh #westmorelandjobs

Nice to be back in the lab after the holidays. No contamination, but would be nice to have a 300 kV TEM! Cryo lamella of Euglena on our JEOL EUROPE F200 with a Fischione Instruments 2552 autogrid cryo transfer rod, prepared by @Ale_Ca_ on a JEOL JSM 4700F Z FIB SEM + Leica Microsystems cryostage

The sample preparation breakthrough of the century. Thursday, May 19, 10 a.m. EST. Webinar registration: bit.ly/Fischione_brea…

Game-changing microelectronics delayering solution. Thursday, May 19, 10 a.m. EST. Webinar registration: bit.ly/Fischione_brea…

Game-changing microelectronics delayering solution. Thursday, May 19, 10 a.m. EDT. Webinar registration: bit.ly/Fischione_brea…

Stop by Fischione Instruments booth #1311; we are excited to talk about our sample preparation products for TEM and SEM: ion mills, plasma cleaners, conventional spec prep, and TEM tomography holders. #MM2023

Today at 2 pm, Fischione Instruments' Pawel Nowakowski will present, "Improved sample preparation technique for transmission Kikuchi diffraction (TKD) analyses allows large area data acquisition" (A02.7) #MM2023

When painting a house, they say the finished product is a product of the surface preparation. It's a similar situation in #electronmicroscopy. If you are at #IMC20 visit the Fischione Instruments to improve your sample preparation or visit 👉 bit.ly/3RjTRjG #SEM #microscopy

E.A. Fischione Instruments, Inc. is looking for an Electromechanical Assembly Technician: eafischione.applicantstack.com/x/detail/a2s5z…

Stop by booth 1027 to discuss how Fischione Instruments can support your sample preparation needs. #mm2024

Stop by booth C22 at #EMC2024 to discuss how Fischione Instruments can help you meet your sample preparation goals.

Today, Pawel Nowakowski presented his work, Strain mapping using high-res EBSD. Thursday, he will present Cecile Bonifacio's work, Correlative TEM/APT studies of Mg samples prepared in controlled environments. Talk with Pawel at stand C22 at #EMC2024.

Journal of Failure Analysis and Prevention (rdcu.be/dSi7o): An integrated solution for millimeter-scale delayering of semiconductor devices. The result is a highly planar surface—up to 10 mm in diameter, uniformity better than 50 nm. bit.ly/ChipMill

Ex situ lift-out specimen thinning: Ar ion milling of specimens on carbon support grids. Learn more at bit.ly/exsitu

Webinar: Preparing APT specimens in a controlled environment Tuesday, November 12, 10 a.m. EST Learn about a sample preparation and analyses workflow using Ar ion beam milling and Ga FIB. Surface damage and oxidation can be completely removed. bit.ly/ControlledEnvi…